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Publications » Characterizing the rate and coherence of single-electron tunneling between two dangling bonds on the surface of silicon

Characterizing the rate and coherence of single-electron tunneling between two dangling bonds on the surface of silicon

Authors

Z. Shaterzadeh-Yazdi
L. Livadaru
M.Taucer
J. Mutus
J. L. Pitters
R.A. Wolkow
Barry Sanders
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